Figure 6: a) SE image of NiTi strand at 5000× magnification of area where the TiC inclusions are present, b), c), d) and e) elemental mapping at the microstructural level by scanning electron microscopy (SEM) with energy dispersive X-ray spectrometry (EDS) in the area with TiC inclusions

Figure 6: a) SE image of NiTi strand at 5000× magnification of area
where the TiC inclusions are present, b), c), d) and e) elemental mapping
at the microstructural level by scanning electron microscopy
(SEM) with energy dispersive X-ray spectrometry (EDS) in the area
with TiC inclusions